Introduction

TLCE - A Temporal Logic with Constrained E vents, formerly known as the First-Order (or Predicate) Sequencing Constraint Logic (FOSCL or PSCL), was proposed to represent test purposes concerning the temporal relationships among input/output (I/O) events and the data dependencies between event parameters

ASTG - A TLCE-Based Symbolic Test Generator

• System Model - Symbolic Transition Graph with Assignment (STGA), extended Finite State Machine (FSM) with state variables and I/O actions
• Property Specification - TLCE, formulas as test purposes
• Test Generation - Slicing the system model with regards to test purposes

Download/Build

 ASTG was developed in Object Caml + C. The source code is free to download.

1. Edit "src/Makefile" to set OCAMLINCLUDE, e.g. <OCAML home directory>/lib/ocaml/
2. Build the source code by typing "make" under src/
3. Run the main program astg [options] "input" > "output"

• input : a symbolic transition graph with assignments + test purposes
• output : symbolic test cases or test sequences with constraints
• options :

-sol	enable constraint solving
-false	enable false conditions
-slice	slice the system model only

Sample Files: 

• buff2 - system model - test sequences
• STG - system model - test sequences

Case Studies - using TorX as the test execution engine

• Conference Protocol 
• Cache Coherence Protocol

Documentation

• Peng Wu, Daguang Liu and Huimin Lin. Symbolic Test Generation Using a Temporal Logic with Constrained Events. Position Paper. In the Proceedings of the 19th IFIP International Conference on Testing of Communicating Systems and the 7th International Workshop on Formal Approaches to Testing of Software (TESTCOM/FATES 2007), Tallinn, Estonia, Jun. 26-29, 2007
• Peng Wu, Huimin Lin, Model-Based Testing of Concurrent Programs with Predicate Sequencing Constraints. International Journal of Software Engineering and Knowledge Engineering, 2006, 16(5): 727 - 746 [abstract+full-text/WorldScientific] A preliminary version of this paper was presented at the 5th International Conference on Quality Software (QSIC 2005) [abstract + full-text/IEEE]

Related Work

• Symbolic Test Generation @ VerTeCs, IRISA/INRIA