Fault Localization Inspired by the PIE Model

Title: Fault Localization Inspired by the PIE Model (in Chinese)
Speaker: Dr. Zhengyu Zhang (State Key Laboratory of Computer Science, ISCAS)
Time: 3:00pm, December 15th (Thursday), 2011.
Venue:Lecture Room, Level 3, Building No. 5, State Key Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences

Abstract: Software is hard to be bug-free, while removing the software faults can be time-consuming. To automate the software debugging process, fault localization is proposed. Existing fault localization techniques assess the suspiciousness of each individual program statements to be related to fault and are empirically evaluated effective. Generally, a program fault needs to be exercised to cause infected program states, which are propagated to be finally observed. The PIE Model describes the necessary condition for a program fault becoming a failure revealed. In this work, we, inspired by the PIE model, propose to use def-use chain as the unit of suspiciousness assessment in fault localization. Preliminary results show that our approaching is promising.

Bibliography:
Zhenyu Zhang is an assistant research professor of the State Key Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences. He received a Ph.D degree in Computer Science from the University of Hong Kong, a BEng degree and a MSc degree in Computer Science and Technology from Tsinghua University. Dr. Zhang’s research interests include debugging and testing of software engineering artifacts, handling the software engineering problems in the wireless sensor network field, and services computing. Dr. Zhang published widely in international journals and conferences, including two articles that won the best paper awards from COMPSAC 2008, COMPSAC 2009, and IEEE Computer Society, an article that was nominated for the best paper award by WWW 2009, as well as articles published in ICSE, FSE, ASE, WWW, JSS, IST, and other venues.